TY - GEN
T1 - Comparison of a large area CZT detector to a spectroscopic CdTe detector for X-ray fluorescence computed tomography
AU - Vernekohl, Don
AU - Streicher, Michael
AU - Ahmad, Moiz
AU - Xing, Lei
AU - He, Zhong
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/10/16
Y1 - 2017/10/16
N2 - X-ray fluorescence CT (XFCT) imaging is a promising molecular imaging modality with high spatial resolution and non-radioactive high atomic number tracers for medical imaging. While dozens of bench-top experiments proofed the concept of the approach, scalability for clinical systems with high molecular sensitivity at acceptable doses is not yet accomplished. This study compares a spectroscopic CdTe detector which was used for XFCT measurements beforehand to a CZT detector with scalable active area. The results show that the CZT detector is able to provide better image quality due to higher detection efficiency even with a significantly reduced energy resolution and absorbing enclosure.
AB - X-ray fluorescence CT (XFCT) imaging is a promising molecular imaging modality with high spatial resolution and non-radioactive high atomic number tracers for medical imaging. While dozens of bench-top experiments proofed the concept of the approach, scalability for clinical systems with high molecular sensitivity at acceptable doses is not yet accomplished. This study compares a spectroscopic CdTe detector which was used for XFCT measurements beforehand to a CZT detector with scalable active area. The results show that the CZT detector is able to provide better image quality due to higher detection efficiency even with a significantly reduced energy resolution and absorbing enclosure.
UR - http://www.scopus.com/inward/record.url?scp=85041492672&partnerID=8YFLogxK
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U2 - 10.1109/NSSMIC.2016.8069551
DO - 10.1109/NSSMIC.2016.8069551
M3 - Conference contribution
AN - SCOPUS:85041492672
T3 - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
BT - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Y2 - 29 October 2016 through 6 November 2016
ER -