Comparison of a large area CZT detector to a spectroscopic CdTe detector for X-ray fluorescence computed tomography

Don Vernekohl, Michael Streicher, Moiz Ahmad, Lei Xing, Zhong He

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

X-ray fluorescence CT (XFCT) imaging is a promising molecular imaging modality with high spatial resolution and non-radioactive high atomic number tracers for medical imaging. While dozens of bench-top experiments proofed the concept of the approach, scalability for clinical systems with high molecular sensitivity at acceptable doses is not yet accomplished. This study compares a spectroscopic CdTe detector which was used for XFCT measurements beforehand to a CZT detector with scalable active area. The results show that the CZT detector is able to provide better image quality due to higher detection efficiency even with a significantly reduced energy resolution and absorbing enclosure.

Original languageEnglish (US)
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
StatePublished - Oct 16 2017
Externally publishedYes
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: Oct 29 2016Nov 6 2016

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Other

Other2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period10/29/1611/6/16

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Nuclear and High Energy Physics
  • Electronic, Optical and Magnetic Materials

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