Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells

Anshu Bagga Mathur; George A. Truskey; W. Monty Reichert

Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells

Anshu Bagga Mathur, George A. Truskey, W. Monty Reichert

Plastic Surgery

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The purpose of this study was to integrate atomic force microscopy (AFM) and total internal reflection fluorescence microscopy (TIRFM) data to determine the effect of localized force application over the cell surface on the cell's focal contacts size and position. TIRFM gives detailed information on the cell-substrate contact regions and AFM is a tool for elasticity measurements, force application, and topographic surface mapping of the cell. Elasticity measurements indicated that the nuclear region was stiffer than the cell body. Following application of nanonewtons force above the nucleus, the cell-substrate contacts rearranged to offset the force. It is evident that the stress applied to the upper surface of the cell is transmitted to the cell-substrate contact region.

Original language	English (US)
Title of host publication	Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Publisher	IEEE
Pages	3
Number of pages	1
ISBN (Print)	0780356756
State	Published - 1999
Event	Proceedings of the 1999 IEEE Engineering in Medicine and Biology 21st Annual Conference and the 1999 Fall Meeting of the Biomedical Engineering Society (1st Joint BMES / EMBS) - Atlanta, GA, USA Duration: Oct 13 1999 → Oct 16 1999

Publication series

Name	Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Volume	1
ISSN (Print)	0589-1019

Other

Other	Proceedings of the 1999 IEEE Engineering in Medicine and Biology 21st Annual Conference and the 1999 Fall Meeting of the Biomedical Engineering Society (1st Joint BMES / EMBS)
City	Atlanta, GA, USA
Period	10/13/99 → 10/16/99

ASJC Scopus subject areas

Signal Processing
Biomedical Engineering
Computer Vision and Pattern Recognition
Health Informatics

Cite this

Mathur, A. B., Truskey, G. A., & Reichert, W. M. (1999). Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells. In Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings (pp. 3). (Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings; Vol. 1). IEEE.

Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells. / Mathur, Anshu Bagga; Truskey, George A.; Reichert, W. Monty.
Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. IEEE, 1999. p. 3 (Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Mathur, AB, Truskey, GA & Reichert, WM 1999, Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells. in Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings, vol. 1, IEEE, pp. 3, Proceedings of the 1999 IEEE Engineering in Medicine and Biology 21st Annual Conference and the 1999 Fall Meeting of the Biomedical Engineering Society (1st Joint BMES / EMBS), Atlanta, GA, USA, 10/13/99.

Mathur AB, Truskey GA, Reichert WM. Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells. In Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. IEEE. 1999. p. 3. (Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings).

Mathur, Anshu Bagga ; Truskey, George A. ; Reichert, W. Monty. / Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells. Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. IEEE, 1999. pp. 3 (Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings).

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abstract = "The purpose of this study was to integrate atomic force microscopy (AFM) and total internal reflection fluorescence microscopy (TIRFM) data to determine the effect of localized force application over the cell surface on the cell's focal contacts size and position. TIRFM gives detailed information on the cell-substrate contact regions and AFM is a tool for elasticity measurements, force application, and topographic surface mapping of the cell. Elasticity measurements indicated that the nuclear region was stiffer than the cell body. Following application of nanonewtons force above the nucleus, the cell-substrate contacts rearranged to offset the force. It is evident that the stress applied to the upper surface of the cell is transmitted to the cell-substrate contact region.",

author = "Mathur, {Anshu Bagga} and Truskey, {George A.} and Reichert, {W. Monty}",

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AB - The purpose of this study was to integrate atomic force microscopy (AFM) and total internal reflection fluorescence microscopy (TIRFM) data to determine the effect of localized force application over the cell surface on the cell's focal contacts size and position. TIRFM gives detailed information on the cell-substrate contact regions and AFM is a tool for elasticity measurements, force application, and topographic surface mapping of the cell. Elasticity measurements indicated that the nuclear region was stiffer than the cell body. Following application of nanonewtons force above the nucleus, the cell-substrate contacts rearranged to offset the force. It is evident that the stress applied to the upper surface of the cell is transmitted to the cell-substrate contact region.

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Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells

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