Contrast-to-noise and exposure measurements of an aSi:H/CsI(Tl) flat-panel based digital radiography system using a QC chest phantom

Xinming Liu, Chris C. Shaw, Peter Balter, S. Cheenu Kappadath, Chao Jen Lai

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The amorphous silicon (a-Si:H) flat panel imaging systems have recently become commercially available and gained acceptance as a promising candidates for implementing digital radiography. In this work, SNRs, CNRs and figure-of-merit, defined as CNR2/SEEs, were measured for a commercial a-Si:H/CsI(Tl) flat-panel digital chest radiography system as a function of the kVp for three different regions in the images of a chest phantom: lung, heart and subphrenic. Using these measurements, issues of image quality and optimal selection of the kVp are discussed.

Original languageEnglish (US)
Pages (from-to)826-832
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5030 II
DOIs
StatePublished - 2003
EventMedical Imaging 2003: Physics of Medical Imaging - San Diego, CA, United States
Duration: Feb 16 2003Feb 18 2003

Keywords

  • Contrast-to-noise ratio
  • Digital radiography
  • Figure-of-merit
  • Flat panel
  • Signal-to-noise ratio

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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