TY - GEN
T1 - Full orientation invarlance and improved feature selectivity of 3D SIFT with application to medical image analysis
AU - Allaire, Stephane
AU - Kim, John J.
AU - Breen, Stephen L.
AU - Jaffray, David A.
AU - Pekar, Vladimir
PY - 2008
Y1 - 2008
N2 - This paper presents a comprehensive extension of the Scale Invariant Feature Transform (SIFT), originally introduced in 21), to volumetric images. While tackling the significant computational efforts required by such multiscale processing of large data volumes, our implementation addresses two important mathematical issues related to the 2D-to-3D extension. It includes efficient steps to filter out extracted point candidates that have low contrast or are poorly localized along edges or ridges. In addition, it achieves, for the first time, full 3D orientation invariance of the descriptors, which is essential for 3D feature matching. An application of this technique is demonstrated to the feature-based automated registration and segmentation of clinical datasets in the context of radiation therapy.
AB - This paper presents a comprehensive extension of the Scale Invariant Feature Transform (SIFT), originally introduced in 21), to volumetric images. While tackling the significant computational efforts required by such multiscale processing of large data volumes, our implementation addresses two important mathematical issues related to the 2D-to-3D extension. It includes efficient steps to filter out extracted point candidates that have low contrast or are poorly localized along edges or ridges. In addition, it achieves, for the first time, full 3D orientation invariance of the descriptors, which is essential for 3D feature matching. An application of this technique is demonstrated to the feature-based automated registration and segmentation of clinical datasets in the context of radiation therapy.
UR - http://www.scopus.com/inward/record.url?scp=51849124561&partnerID=8YFLogxK
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U2 - 10.1109/CVPRW.2008.4563023
DO - 10.1109/CVPRW.2008.4563023
M3 - Conference contribution
AN - SCOPUS:51849124561
SN - 9781424423408
T3 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
BT - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
T2 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
Y2 - 23 June 2008 through 28 June 2008
ER -