Abstract
This paper presents a technique for classifying skin abnormalities using oblique-incidence diffuse reflectance spectroscopy. The objective is to provide a non-invasive computer-assisted tool to dermatologists for lowering the number of unnecessary biopsies. A high accuracy of detection (95%) has been obtained.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2249-2250 |
| Number of pages | 2 |
| Journal | Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings |
| Volume | 3 |
| State | Published - 2002 |
| Event | Proceedings of the 2002 IEEE Engineering in Medicine and Biology 24th Annual Conference and the 2002 Fall Meeting of the Biomedical Engineering Society (BMES / EMBS) - Houston, TX, United States Duration: Oct 23 2002 → Oct 26 2002 |
Keywords
- Cancer detection
- Oblique-incidence reflectometry
- Skin cancer
- Spectroscopy
ASJC Scopus subject areas
- Signal Processing
- Biomedical Engineering
- Computer Vision and Pattern Recognition
- Health Informatics