The morphology of carbon films and surfaces studied by photoemission electron microscopy

Congjun Wang; Martin E. Kordesch

doi:10.1016/0304-3991(91)90147-X

The morphology of carbon films and surfaces studied by photoemission electron microscopy

Congjun Wang, Martin E. Kordesch

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Several types of high-density carbon thin films and the natural diamond (100) surface have been imaged using photoemission electron microscopy (PEEM). The material contrast and monolayer sensitivity of PEEM that arises from work function differences at the surface allows carbon films to be detected and localized before crystallites are formed. Material contrast can also be observed in films of seemingly identical morphology.

Original language	English (US)
Pages (from-to)	154-163
Number of pages	10
Journal	Ultramicroscopy
Volume	36
Issue number	1-3
DOIs	https://doi.org/10.1016/0304-3991(91)90147-X
State	Published - May 1991
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(91)90147-X

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title = "The morphology of carbon films and surfaces studied by photoemission electron microscopy",

abstract = "Several types of high-density carbon thin films and the natural diamond (100) surface have been imaged using photoemission electron microscopy (PEEM). The material contrast and monolayer sensitivity of PEEM that arises from work function differences at the surface allows carbon films to be detected and localized before crystallites are formed. Material contrast can also be observed in films of seemingly identical morphology.",

author = "Congjun Wang and Kordesch, {Martin E.}",

year = "1991",

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doi = "10.1016/0304-3991(91)90147-X",

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AU - Wang, Congjun

AU - Kordesch, Martin E.

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N2 - Several types of high-density carbon thin films and the natural diamond (100) surface have been imaged using photoemission electron microscopy (PEEM). The material contrast and monolayer sensitivity of PEEM that arises from work function differences at the surface allows carbon films to be detected and localized before crystallites are formed. Material contrast can also be observed in films of seemingly identical morphology.

AB - Several types of high-density carbon thin films and the natural diamond (100) surface have been imaged using photoemission electron microscopy (PEEM). The material contrast and monolayer sensitivity of PEEM that arises from work function differences at the surface allows carbon films to be detected and localized before crystallites are formed. Material contrast can also be observed in films of seemingly identical morphology.

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U2 - 10.1016/0304-3991(91)90147-X

DO - 10.1016/0304-3991(91)90147-X

M3 - Article

AN - SCOPUS:0026153588

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EP - 163

JO - Ultramicroscopy

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ER -

The morphology of carbon films and surfaces studied by photoemission electron microscopy

Abstract

ASJC Scopus subject areas

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