Two-dimensional growth of high-quality strontium titanate thin films on Si

H. Li, X. Hu, Y. Wei, Z. Yu, X. Zhang, R. Droopad, A. A. Demkov, J. Edwards, K. Moore, W. Ooms, J. Kulik, P. Fejes

Research output: Contribution to journalArticlepeer-review

137 Scopus citations

Abstract

The two-dimensional growth of high-quality strontium titanate thin films on Si was discussed. A stepped growth method that utilizes the kinetic characteristics of the growth process to suppress the oxidation of the substrate surface was analyzed. The epitaxy of high-quality SrTiO3 (STO) thin films directly on Si was achieved and the chemical and structural properties of the STO/Si interface were evaluated.

Original languageEnglish (US)
Pages (from-to)4521-4525
Number of pages5
JournalJournal of Applied Physics
Volume93
Issue number8
DOIs
StatePublished - Apr 15 2003
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy

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