Abstract
The two-dimensional growth of high-quality strontium titanate thin films on Si was discussed. A stepped growth method that utilizes the kinetic characteristics of the growth process to suppress the oxidation of the substrate surface was analyzed. The epitaxy of high-quality SrTiO3 (STO) thin films directly on Si was achieved and the chemical and structural properties of the STO/Si interface were evaluated.
Original language | English (US) |
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Pages (from-to) | 4521-4525 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 93 |
Issue number | 8 |
DOIs | |
State | Published - Apr 15 2003 |
Externally published | Yes |
ASJC Scopus subject areas
- General Physics and Astronomy