Goodness-of-Fit Diagnostics for Bayesian Hierarchical Models

Ying Yuan, Valen E. Johnson

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

This article proposes methodology for assessing goodness of fit in Bayesian hierarchical models. The methodology is based on comparing values of pivotal discrepancy measures (PDMs), computed using parameter values drawn from the posterior distribution, to known reference distributions. Because the resulting diagnostics can be calculated from standard output of Markov chain Monte Carlo algorithms, their computational costs are minimal. Several simulation studies are provided, each of which suggests that diagnostics based on PDMs have higher statistical power than comparable posterior-predictive diagnostic checks in detecting model departures. The proposed methodology is illustrated in a clinical application; an application to discrete data is described in supplementary material.

Original languageEnglish (US)
Pages (from-to)156-164
Number of pages9
JournalBiometrics
Volume68
Issue number1
DOIs
StatePublished - Mar 2012

Keywords

  • Discrepancy measures
  • Markov chain Monte Carlo
  • Model checking
  • Model criticism
  • Model hierarchy
  • Posterior-predictive density

ASJC Scopus subject areas

  • Statistics and Probability
  • General Biochemistry, Genetics and Molecular Biology
  • General Immunology and Microbiology
  • General Agricultural and Biological Sciences
  • Applied Mathematics

MD Anderson CCSG core facilities

  • Biostatistics Resource Group

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